Corporate Name
I-BIT Co., Ltd.
Head Office
Sakado 3chome,2-1,Takatsu-ku Kawasaki City,
Kanagawa Science Park (KSP) East Wing 6F
Zip：213-0012
TEL：044-829-0067, FAX:：044-829-1055
Representative
Keisuke Mukoyama, President
Establishment
September 1, 2000
Capital
50 Million Yen
Business Lineup
Development, manufacturing and distribution of X-ray equipment for semiconductor packages
Development, manufacturing and distribution of X-ray inspection equipment for PC boards
Maintenance of imported X-ray units
Manufacturing and distribution of PC board manufacturing equipment
Distribution of computers and peripherals
Full view of Kanagawa SP
Access Map
The Summit of Nine Prefectures & Cities aims to take a pro proactive stance to solve regional issues cooperatively by improving overall
conditions of human life through utilization of enormous shared
regional resources under the long-term outlook.
The summit members are the leaders (governors and mayors) of
Saitama, Chiba, Tokyo and Kanagawa (prefectures) in addition to
Yokohama, Kawasaki, Chiba and Saitama (cities).
To address cooperative measures in the Tokyo
metropolitan area in the future, nine local government
leaders as well as economic leaders created a forum
to exchange frank opinions about a wide variety topics
based on the ongoing efforts of the private and
the government sectors.
Representing Kanagawa, I-BIT Co., Ltd.
“X-ray Stereo Method” to inspect
electronics packages
Governor of
Kanagawa Pref.
Keisuke Mukoyama
I-BIT Co., Ltd.
Website of Kanagawa Industrial Technology Center
No. 28 Grand Prize Winners have been selected ! !
New “one-of-a-kind” technologies of small business [pride of Kanagawa]
Award winners of High-Tech Grand Prix of 2011 were determined. Among 40 candidates with excellent technologies or products of small-and medium-sized enterprises in Kanagawa, two Grand Prize winners, two Regional Environment Technology Award winners and three Encouragement Prize winners were selected by the Selection Committee on August 9. For the details of each technology or product, please click the links in the table below.
Prize |
Winner [Size: Capital/Employees] (Location: HQ or Development |
Technology /Product |
Description |
Grand Prix |
I-BIT Co., Ltd. |
Inspection device of electronic circuit boards by the X-ray imaging system with stereo differential method |
This technology has large growth potential in the field of surface-mount packages because its high-speed and superior cost performance based on the originally developed element technologies will stand out for the inspection of semi-conductors and electronic components pursuing density growth by 3D mounting. |
Governor of
Kanagawa Pref.
Mukoyama
(I-BIT)
I BIT when X 2000, Sep I-X-ray equipment business was transferred by Matsushita Inter-Techno (Panasonic Techno Trading, Tokyo Gotanda,now); started maintenance services of X-ray equipment.
2001, JuneDisplayed self-develop X-ray inspection device (IX-100) in “JPCA Show”.
2002, NovStructural inspection by the real-time X-ray equipment was certified by
“Act of Advancement of Creative Business by Minor Enterprises”.
Changed to Corporate from Limited Company
2002, DecIn-line X-ray device & Desk-top X-ray inspection device were certified by
“Act of Innovative Management by Minor Enterprises”.
In-line X-ray device (FX-355) & Desk-top X-ray inspection device (FX-60) were displayed in Inter-Nepcon Show.
2003, SepDevelopment of Inspection Device using X-ray reflective waves won
“Kawasaki Award for Excellence of Entrepreneur” & “Award of Japan Entrepreneurs Association”.
Rewarded with “New Business Creation Grant” for development of Inspection Device using X-ray reflective waves byJSBC (Japan Small Business Corporation).
2004, OctDeveloped X-ray inspection device for power semi-conductors for hybrid cars; started to supply
2004, NovDeveloped X-ray inspection device with hydrogen reduction reflow for power semi-conductors for hybrid cars; started to supply
2005, AprIntroduced nano-focus X-ray device “IX-1600”; adopted the open type X-ray tube with 1200X max. & focus diameter of 400 nanometers (best resolution in the world).
2005, MayStarted with Joint research of phase acquisition of X-ray with Musashi Institute of Technology, Engineering Department
2005, Dec Started joint development of X-ray CT with Hosei University, Engineering Department 2006, MayDeveloped the world-first X-ray inspection device for internal crystal defect of pinhole in silicon wafer; started to supply
2006, DecPresented the compact & high magnification X-ray exam device (FX-300t) at SEMICON; achieved 800X of geometric magnification while using a sealed X-ray tube
2007, JanDeveloped the X-ray inspection device (IX-500IGBT) for power semiconductors; supplied to H as the power semiconductor inspection device for Shinkansen
2008, MayDeveloped the industry-first “Die-bonder device + X-ray inspection device” for power semiconductors;
supplied to PowerSemiconductor Institute
Announced the industry-first “X-ray Stereo Image Differential Method” to remove the SM board’s bottom side information.
2011, SepThe method above won Grand Prize Prize of Kanagawa Hi-tech Grand Prix; commended by Kanagawa Pref. Governor.
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